tengo un Lenovo G-500 con un SSD 250Gb con Windows 8 y Debian testing en partición dual (siempre trabajo en debian) y un HDD Hitachi de 500Gb particionado a 250Gb para cada sistema.
este fin de semana mi portátil empezó a emitir un ruido similar a un grillo y me dio problemas de arranque del sistema. No he tenido mucho tiempo de testear el disco HDD.
Tengo este error:
Código:
# smartctl -a /dev/sdb
smartctl 6.6 2016-05-31 r4324 [x86_64-linux-4.6.0-1-amd64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi/HGST Travelstar Z5K500
Device Model: HGST HTS545050A7E380
Serial Number: TM85014C1EK0AL
LU WWN Device Id: 5 000cca 72fd4402f
Firmware Version: GG2OAC90
User Capacity: 500.107.862.016 bytes [500 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Tue Sep 20 20:00:56 2016 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 113) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 201 201 033 Pre-fail Always - 1
4 Start_Stop_Count 0x0012 099 099 000 Old_age Always - 1624
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 097 097 067 Pre-fail Always - 196608
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 098 098 000 Old_age Always - 1268
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1621
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 52
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 3311
194 Temperature_Celsius 0x0002 187 187 000 Old_age Always - 32 (Min/Max 13/40)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2 occurred at disk power-on lifetime: 1256 hours (52 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 08 d0 02 12 00 Error: IDNF at LBA = 0x001202d0 = 1180368
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 04 48 b0 cd 10 40 00 00:18:20.235 READ FPDMA QUEUED
60 08 40 a0 49 0a 40 00 00:18:20.235 READ FPDMA QUEUED
60 08 38 f0 d0 11 40 00 00:18:20.235 READ FPDMA QUEUED
60 08 30 38 d9 11 40 00 00:18:20.235 READ FPDMA QUEUED
60 08 28 d0 02 12 40 00 00:18:20.235 READ FPDMA QUEUED
Error 1 occurred at disk power-on lifetime: 1255 hours (52 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 02 b0 64 0b 00 Error: IDNF at LBA = 0x000b64b0 = 746672
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 02 60 b0 64 0b 40 00 00:14:27.550 READ FPDMA QUEUED
61 08 58 f0 28 64 40 00 00:14:25.150 WRITE FPDMA QUEUED
ea 00 00 00 00 00 a0 00 00:14:22.582 FLUSH CACHE EXT
61 08 48 f8 33 2c 40 00 00:14:22.582 WRITE FPDMA QUEUED
ea 00 00 00 00 00 a0 00 00:14:22.567 FLUSH CACHE EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 1257 -
# 2 Short offline Completed without error 00% 1257 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
El disco tiene un año y me cubre la garantía pero después de analizarlo el servicio técnico de ellos.
¿Este error puede derivar en ruido mecánico o el fallo mecánico ocasiona este error? ¿Me lo cubrirá la garantía?
Un saludo.